About this scholarly article

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Thin-Film Coatings for Optical Applications IV - Analyses of structural films using effective refractive index model by Chang, Te-Hung; Yeh, Yu-Wen; Chen, Sheng-Hui; Lee, Cheng-Chung; Ellison, Michael J. is a scholarly article available to read on EtoBox.

Author

Chang, Te-Hung; Yeh, Yu-Wen; Chen, Sheng-Hui; Lee, Cheng-Chung; Ellison, Michael J.

Publisher

SPIE

Published

2007

Language

EN