About this scholarly article

SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - The model about the package structure of LED and the light intensity distribution by Han, Sen; Yoshizawa, Toru; Zhang, Song; Sun, Haojie; Li, Mengyuan; Zhuang, Jie; Zhang, Dawei is a scholarly article available to read on EtoBox.

Author

Han, Sen; Yoshizawa, Toru; Zhang, Song; Sun, Haojie; Li, Mengyuan; Zhuang, Jie; Zhang, Dawei

Publisher

SPIE

Published

2014

Language

EN