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Metrology Gaps in Semiconductor Ecosystem by SOURABH UPADHYAY is a document available to read on EtoBox.

What is Metrology Gaps in Semiconductor Ecosystem about?

This document outlines the creation and strategic priorities of the CHIPS Research and Development Metrology Program (CHIPS R&D Metrology Program). It describes how NIST engaged stakeholders, conducted market research, and used strategic planning to design a program to strengthen the US semiconductor industry through advanced metrology. The document identifies 7 "Grand Challenges" and 10 priority areas for the program

Author

SOURABH UPADHYAY

Language

EN