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About this Engineering article
Different Tips for High-resolution Atomic Force Microscopy and Scanning Tunneling Microscopy of Single Molecules by Mohn, Fabian; Schuler, Bruno; Gross, Leo; Meyer, Gerhard is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Mohn, Fabian; Schuler, Bruno; Gross, Leo; Meyer, Gerhard
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2013
- Field
- Engineering (Physical Sciences)
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