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Measurement-induced Criticality in Extended and Long-range Unitary Circuits by Sharma, Shraddha; Turkeshi, Xhek; Fazio, Rosario; Dalmonte, Marcello is a scholarly article available to read on EtoBox.

What is Measurement-induced Criticality in Extended and Long-range Unitary Circuits about?

We explore the dynamical phases of unitary Clifford circuits with variable-range interactions, coupled to a monitoring environment. We investigate two classes of models, distinguished by the action of the unitary gates, which either are organized in clusters of finite-range two-body gates, or are pair-wise interactions randomly distributed throughout the system with a power-law distribution. We find the range of the interactions plays a key role in characterizing both phases and their measurement-induced transitions. For the cluster unitary gates we find a transition between a phase with volume-law scaling of the entanglement entropy and a phase with area-law entanglement entropy. Our results indicate that the universality class of the phase transition is compatible to that of short range hybrid Clifford circuits. Oppositely, in the case of power-law distributed gates, we find the universality class of the phase transition changes continuously with the parameter controlling the range of interactions. In particular, for intermediate values of the control parameter, we find a non-conformal critical line which separates a phase with volume-law scaling of the entanglement entropy from

Author

Sharma, Shraddha; Turkeshi, Xhek; Fazio, Rosario; Dalmonte, Marcello

Published

2021

Language

EN