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About this Engineering article
Enhanced Radiation Hardness in SOI MOSFET with Embedded Tunnel Diode Layer by Huang, Huixiang; Wei, Sufen; Tang, Kai; Pan, Jinyan; Xu, Wenbin; Wei, Yafen; Wu, Yiliang; Zhang, Zhengxuan; Geng, Li is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Huang, Huixiang; Wei, Sufen; Tang, Kai; Pan, Jinyan; Xu, Wenbin; Wei, Yafen; Wu, Yiliang; Zhang, Zhengxuan; Geng, Li
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)