About this scholarly article

2015 IEEE International Advance Computing Conference (IACC) - Integrated test environment for combinatorial testing by Patil, Abhinandan H.; Satish, Preeti; Goveas, Neena; Rangarajan, Krishnan is a scholarly article available to read on EtoBox.

Author

Patil, Abhinandan H.; Satish, Preeti; Goveas, Neena; Rangarajan, Krishnan

Publisher

IEEE

Published

2015