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About this book
VLSI Fault Modeling and Testing Techniques: (VLSI Design Automation Series) by Zobrist, George W. (George Winston), 1934- is a book available to read on EtoBox.
- Author
- Zobrist, George W. (George Winston), 1934-
- Publisher
- Norwood, NJ : Ablex Pub. Corp.
- Published
- 1993
- Language
- EN
- ISBN
- 9780893917814
- Subjects
- Engineering, Mathematics, Psychology
Other editions & translations
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