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About this Engineering article
Nano-Scale Characterization of Surface Enhanced Raman Spectroscopic Substrates by A.R.M. Radzol; Khuan Y. Lee; W. Mansor; S.R. Yahaya is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- A.R.M. Radzol; Khuan Y. Lee; W. Mansor; S.R. Yahaya
- Publisher
- Elsevier ; [Oxford]: Elsevier Ltd.; Elsevier BV (ISSN 1877-7058)
- Published
- 2012
- Language
- EN
- Field
- Engineering (Physical Sciences)
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