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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Optical Systems Contamination and Degradation - Comparison of high-frequency quartz crystal microbalances' (QCMs') mass sensitivities to theory by Wallace, Donald A.; Wallace, Scott A.; Wood, Bob E.; Chen, Philip T. C.; McClintock, William E.; Rottman, Gary J. is a scholarly article available to read on EtoBox.

Author
Wallace, Donald A.; Wallace, Scott A.; Wood, Bob E.; Chen, Philip T. C.; McClintock, William E.; Rottman, Gary J.
Publisher
SPIE
Published
1998
Language
EN