About this Engineering article
Bottom-tracking: the Possibilities and Physical Meaning of Keeping the Bottom of the Frequency Shift in Atomic Force Microscopy by Damiron, Denis; Allain, Pierre E.; Kobayashi, Dai; Sasaki, Naruo; Kawakatsu, Hideki is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Damiron, Denis; Allain, Pierre E.; Kobayashi, Dai; Sasaki, Naruo; Kawakatsu, Hideki
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2020
- Field
- Engineering (Physical Sciences)