Opening book details…
About this Engineering article
Extrapolation of high-voltage stress measurements to lowvoltage operation for thin silicon-oxide films : D. J. Dumin, K. J. Dickerson and G. A. Brown. IEEE Trans. Reliab.40(1), 102 (1991) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1992
- Field
- Engineering (Physical Sciences)