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About this Physics and Astronomy article
Extraction of Slow Oxide Trap Concentration Profiles in Metal–oxide–semiconductor Transistors Using the Charge Pumping Method by Maneglia, Y.; Bauza, D. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Maneglia, Y.; Bauza, D.
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 1996
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)