About this scholarly article

Conference Record IEEE Instrumentation and Measurement Technology Conference - Metropolitan, NY, USA (12-14 May 1992)] [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference - Testing the performance of delta-sigma ADCs by El-Koubysi, A.R.; Guo, Y.; Lucas, M.S.P. is a scholarly article available to read on EtoBox.

Author

El-Koubysi, A.R.; Guo, Y.; Lucas, M.S.P.

Publisher

IEEE

Published

1992