About this scholarly article

2005 IEEE International Symposium on Circuits and Systems - Deterministic and Low Power BIST Based on Scan Slice Overlapping by Ji Li, ; Yinhe Han, ; Xiaowei Li, is a scholarly article available to read on EtoBox.

Author

Ji Li, ; Yinhe Han, ; Xiaowei Li,

Publisher

IEEE

Published

2005

Language

EN