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About this scholarly article
SPIE Proceedings [SPIE Fifth International Symposium on Optical Storage (IS0S 2000) - Shanghai, China (Monday 22 May 2000)] Fifth International Symposium on Optical Storage (ISOS 2000) - Near-line inspector of optical disk parameters by Meng, Desheng; Ma, Lijun; Pan, Longfa; Zhang, Lei; Gan, Fuxi; Hou, Lisong is a scholarly article available to read on EtoBox.
- Author
- Meng, Desheng; Ma, Lijun; Pan, Longfa; Zhang, Lei; Gan, Fuxi; Hou, Lisong
- Publisher
- SPIE
- Published
- 2001
- Language
- EN
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