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About this Engineering article

Coulomb Blockade in Resistively Coupled Single-Electron Transistor: Dependence on Bias Conditions by Y. A. Pashkin; Y. Nakamura; J. Tsai is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Y. A. Pashkin; Y. Nakamura; J. Tsai
Publisher
Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
Published
1999
Language
EN
Field
Engineering (Physical Sciences)