About this scholarly article

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Reflective interferometer for investigation of amplitude-phase characteristics of semiconductor nanostructures by Kovalyov, A. A.; Putyato, M. A.; Preobrazhenskii, V. V.; Pchelyakov, O. P.; Rubtsova, N. N.; Samartsev, Vitaly V. is a scholarly article available to read on EtoBox.

Author

Kovalyov, A. A.; Putyato, M. A.; Preobrazhenskii, V. V.; Pchelyakov, O. P.; Rubtsova, N. N.; Samartsev, Vitaly V.

Publisher

SPIE

Published

2008