About this scholarly article

2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Crosstalk and switching noise mechanism study in high density wire-bond FPGA device by Siow Chek Tan, ; Yee Huan Yew, ; Hong Shi, is a scholarly article available to read on EtoBox.

Author

Siow Chek Tan, ; Yee Huan Yew, ; Hong Shi,

Publisher

IEEE

Published

2008