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About this Engineering article
Optical Characterization of Arsenic-doped Silica-on-silicon Waveguides Using Femtosecond Optical-time-domain-reflectometry Techniques by McGoldrick, E.; Beaud, P.; Schutz, J.; Hodel, W.; Deutsch, C.; Thomas, N.; Hubbard, S. A. is a Engineering article available to read on EtoBox.
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- Author
- McGoldrick, E.; Beaud, P.; Schutz, J.; Hodel, W.; Deutsch, C.; Thomas, N.; Hubbard, S. A.
- Publisher
- Optical Society of America; The Optical Society (ISSN 0146-9592)
- Published
- 1990
- Language
- EN
- Field
- Engineering (Physical Sciences)