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About this Engineering article
Free Electrons and Defects in Microcrystalline Silicon Studied by Electron Spin Resonance by Finger, F.; Malten, C.; Hapke, P.; Carius, R.; Flückiger, R.; Wagner, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Finger, F.; Malten, C.; Hapke, P.; Carius, R.; Flückiger, R.; Wagner, H.
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0950-0839)
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)
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