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2013 IEEE 22nd Conference on Electrical Performance of Electronic Packaging and Systems - Applying a physics-based via model for the simulation of Through Silicon Vias by Dahl, David; Duan, Xiaomin; Beyreuther, Anne; Ndip, Ivan; Lang, Klaus-Dieter; Schuster, Christian is a scholarly article available to read on EtoBox.

Author
Dahl, David; Duan, Xiaomin; Beyreuther, Anne; Ndip, Ivan; Lang, Klaus-Dieter; Schuster, Christian
Publisher
IEEE
Published
2013
Language
EN