About this scholarly article

2005 International Semiconductor Device Research Symposium - The Impact of Surface Defects on SiC Schottky and Ohmic Contact Formation by Brillson, L.J.; Tumakha, S.P.; Gao, M.; Ewing, D.J.; Porter, L.M.; Okojie, R.S.; Zhang, M.; Pirouz, P.; Wahab, Q.; Ma, X.; Sudharshan, T.S.; Onishi, T.; Tsukimoto, S.; Murakami, M. is a scholarly article available to read on EtoBox.

Author

Brillson, L.J.; Tumakha, S.P.; Gao, M.; Ewing, D.J.; Porter, L.M.; Okojie, R.S.; Zhang, M.; Pirouz, P.; Wahab, Q.; Ma, X.; Sudharshan, T.S.; Onishi, T.; Tsukimoto, S.; Murakami, M.

Publisher

IEEE

Published

2005