Skip to content

Opening book details…

About this Materials Science article

In Situ Measurement of Depletion Caused by SDBS Micelles on the Surface of Silica Particles Using Optical Tweezers by Liu, Shuai duplicate; hu, yue; Xia, Jing; Fang, Shenwen; duan, ming is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Liu, Shuai duplicate; hu, yue; Xia, Jing; Fang, Shenwen; duan, ming
Publisher
American Chemical Society; American Chemical Society (ACS) (ISSN 0743-7463)
Published
2019
Field
Materials Science (Physical Sciences)

More by Liu, Shuai duplicate; hu, yue; Xia, Jing; Fang, Shenwen; duan, ming

Browse all works by Liu, Shuai duplicate; hu, yue; Xia, Jing; Fang, Shenwen; duan, ming