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About this Engineering article
Highly Reliable Integrated Gate Driver Circuit for Large TFT-LCD Applications by Chih-Lung Lin; Mao-Hsun Cheng; Chun-Da Tu; Min-Chin Chuang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chih-Lung Lin; Mao-Hsun Cheng; Chun-Da Tu; Min-Chin Chuang
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 2012
- Language
- EN
- Field
- Engineering (Physical Sciences)
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