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About this Engineering article
Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography by Singh, Sudhanshu S. (author);Loza, Jose J. (author);Merkle, Arno P. (author);Chawla, Nikhilesh (author) is a Engineering article available to read on EtoBox.
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- Author
- Singh, Sudhanshu S. (author);Loza, Jose J. (author);Merkle, Arno P. (author);Chawla, Nikhilesh (author)
- Publisher
- Elsevier Inc.
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)