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About this Engineering article
Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits by Savaria, Y.; Rumin, N.C.; Hayes, J.F.; Agarwal, V.K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Savaria, Y.; Rumin, N.C.; Hayes, J.F.; Agarwal, V.K.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9219)
- Published
- 1986
- Field
- Engineering (Physical Sciences)
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