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About this scholarly article
2009 International Conference on Advances in Recent Technologies in Communication and Computing - Voltage Profile Improvement Using FACTS Devices: A Comparison between SVC, TCSC and TCPST by Bhaskar, M. Arun; Subramani, C.; Kumar, M. Jagdeesh; Dash, S.S. is a scholarly article available to read on EtoBox.
- Author
- Bhaskar, M. Arun; Subramani, C.; Kumar, M. Jagdeesh; Dash, S.S.
- Publisher
- IEEE
- Published
- 2009
- Language
- EN