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2009 International Conference on Advances in Recent Technologies in Communication and Computing - Voltage Profile Improvement Using FACTS Devices: A Comparison between SVC, TCSC and TCPST by Bhaskar, M. Arun; Subramani, C.; Kumar, M. Jagdeesh; Dash, S.S. is a scholarly article available to read on EtoBox.

Author
Bhaskar, M. Arun; Subramani, C.; Kumar, M. Jagdeesh; Dash, S.S.
Publisher
IEEE
Published
2009
Language
EN