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About this Engineering article
The analysis on the origin of high resistivity in Cl-doped polycrystalline CdZnTe thick films by K. H. Kim; Y. J. Park; Y. H. Na; J. K. Hong; T. R. Jung; Y. Yi; S. U. Kim is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- K. H. Kim; Y. J. Park; Y. H. Na; J. K. Hong; T. R. Jung; Y. Yi; S. U. Kim
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - V C H Verlag GmbbH & Co.; Wiley (ISSN 1862-6351)
- Published
- 2004
- Language
- EN
- Field
- Engineering (Physical Sciences)
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