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The 31st IEEE International Conference on Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. - Characterization of the 20-T immersed diode on RITS-3 by Rovang, D.; Cordova, S.; Hahn, K.; Maenchen, J.; Molina, I.; Portillo, S.; Oliver, B.; Rose, D.; Welch, D.; Cooper, G.; McLean, J. is a scholarly article available to read on EtoBox.

Author
Rovang, D.; Cordova, S.; Hahn, K.; Maenchen, J.; Molina, I.; Portillo, S.; Oliver, B.; Rose, D.; Welch, D.; Cooper, G.; McLean, J.
Publisher
IEEE
Published
2004
Language
EN

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