About this scholarly article

2018 IEEE 20th Electronics Packaging Technology Conference (EPTC) - High-resolution Time-domain Reflectometry Analysis in Back-end-of-line (BEOL) by Recursive Circuit Modelling by Shang, Yang; Shinohara, Makoto; Radhamony, Rahul Babu; Kiljan, Joanna; Wu, Alan is a scholarly article available to read on EtoBox.

Author

Shang, Yang; Shinohara, Makoto; Radhamony, Rahul Babu; Kiljan, Joanna; Wu, Alan

Publisher

IEEE

Published

2018

Language

EN