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About this Engineering article
Defect — Deformation Nanometer Self-organisation Upon Laser Recrystallisation of Thin Amorphous Films on Substrates by V. I. Emel'yanov; K. I. Eremin; A. A. Sumbatov is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- V. I. Emel'yanov; K. I. Eremin; A. A. Sumbatov
- Publisher
- Turpion Limited; Turpion ; Turpion Ltd; IOP Publishing (ISSN 1063-7818)
- Published
- 2002
- Field
- Engineering (Physical Sciences)
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