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Scan Through TAP by ajayg_lmg is a document available to read on EtoBox.

What is Scan Through TAP about?

The document discusses Scan-Through-TAP, which combines internal scan chains and boundary scan features in system-on-chip designs. It reduces scan pins, allows access to internal scan chains through the test access port controller, and provides a single shift path for burn-in and diagnostics. Implementation results on a processor-based SOC show a small chip area overhead and high fault coverage are achieved.

Author

ajayg_lmg

Language

EN