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About this Engineering article
Wafer Level Recombination Carrier Lifetime Measurements of 4H-SiC PiN Epitaxial Wafers by Chung, Gil Yong; Loboda, Mark J.; MacMillan, Mike F.; Wan, Jian Wei is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chung, Gil Yong; Loboda, Mark J.; MacMillan, Mike F.; Wan, Jian Wei
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)
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