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About this Engineering article
TFT-LCD Mura Defects Using Independent Component Analysis by CHEN, Shang Liang; YANG, Chi Chin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- CHEN, Shang Liang; YANG, Chi Chin
- Publisher
- The Japan Society of Mechanical Engineers; Japan Society of Mechanical Engineers (ISSN 1881-3054)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)