About this scholarly article

2012 15th International Workshop on Computational Electronics - Reliability of GaN HEMTs: Current degradation in GaN/AlGaN/AlN/GaN HEMT by Padmanabhan, Balaji; Vasileska, Dragica; Goodnick, Stephen M. is a scholarly article available to read on EtoBox.

Author

Padmanabhan, Balaji; Vasileska, Dragica; Goodnick, Stephen M.

Publisher

IEEE

Published

2012

Language

EN