About this scholarly article

IEEE Nuclear Science Symposium Conference Record, 2005 - A CMOS Circuit for High-Stability X-Ray Spectroscopy with Silicon Drift Detectors with on-Chip JFET by Fiorini, C.; Frizzi, T.; Longoni, A.; Porro, M. is a scholarly article available to read on EtoBox.

Author

Fiorini, C.; Frizzi, T.; Longoni, A.; Porro, M.

Publisher

IEEE

Published

2005

Language

EN