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About this Engineering article
Selective State Retention Power Gating Based on Gate-Level Analysis by Greenberg, Shlomo; Rabinowicz, Joseph; Tsechanski, Ron; Paperno, Eugene is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Greenberg, Shlomo; Rabinowicz, Joseph; Tsechanski, Ron; Paperno, Eugene
- Publisher
- Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1549-8328)
- Published
- 2014
- Field
- Engineering (Physical Sciences)
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