About this scholarly article

IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Measurement of field emission characteristics from transition metal nitride and carbide thin films by Gotoh, Y.; Liao, M.Y.; Tsuji, H.; Ishikawa, J. is a scholarly article available to read on EtoBox.

Author

Gotoh, Y.; Liao, M.Y.; Tsuji, H.; Ishikawa, J.

Publisher

Japan Soc. Promotion of Sci

Published

2003