About this scholarly article

2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Global and Local Characterization of Passivated Aluminum Metallization Film for Extracting Elastoplastic Constitutive Model by Lin, Hung-Yun; Gurrum, Siva P. is a scholarly article available to read on EtoBox.

Author

Lin, Hung-Yun; Gurrum, Siva P.

Publisher

IEEE

Published

2016

Language

EN