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2012 IEEE 15th International Conference on Computational Science and Engineering - Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets by Abbasitabar, Hamed; Zarandi, Hamid R.; Salamat, Ronak is a scholarly article available to read on EtoBox.

Author
Abbasitabar, Hamed; Zarandi, Hamid R.; Salamat, Ronak
Publisher
IEEE
Published
2012
Language
EN