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About this Materials Science article
An investigation of the hydrogenated Si-SiO2 interface by X-ray diffraction by Rzhanov, A.E.; Filippov, V.I.; Chaplanov, V.A.; Yakimov, S.S. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Rzhanov, A.E.; Filippov, V.I.; Chaplanov, V.A.; Yakimov, S.S.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-577X)
- Published
- 1988
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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