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IMS3TW LANOT BALEN-camera Final by kirthana1702 is a document available to read on EtoBox.

This paper investigates fault mitigation strategies for Single Event Transients (SETs) affecting Successive Approximation Register (SAR) converters based on charge redistribution. It discusses the susceptibility of these converters to transient faults, the impact of such faults on output bits, and evaluates various mitigation techniques, including the use of Built-In Bulk Current Sensors (BULK-BICS) and transistor sizing. The findings are based on extensive fault injection simulations conducted in a 130nm p

Author

kirthana1702

Language

EN