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About this Engineering article

The Effects of Annealing on the Structure and Composition of Electron-beam-evaporated Tin Oxide Films by N.S. Choudhury; R.P. Goehner; N. Lewis; R.W. Green is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
N.S. Choudhury; R.P. Goehner; N. Lewis; R.W. Green
Publisher
Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
Published
1984
Field
Engineering (Physical Sciences)