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About this Engineering article
Porous Silicon Characterization by X-ray Reflectivity: Problems Arising from Using a Vacuum Environment with Synchrotron Beam by Sama, S; Ferrero, C; Lequien, S; Milita, S; Romestain, R; Servidori, M; Setzu, S; Thiaudière, D is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sama, S; Ferrero, C; Lequien, S; Milita, S; Romestain, R; Servidori, M; Setzu, S; Thiaudière, D
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0022-3727)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)