Opening book details…
About this Materials Science article
Deep Learning-based Automated Measurement Method for Cross-sectional SEM Images in Semiconductor Devices by Okuyama, Yutaka; Ohmori, Takeshi is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Okuyama, Yutaka; Ohmori, Takeshi
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2020
- Field
- Materials Science (Physical Sciences)