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Assessing Fault Model and Test Quality by Kenneth M. Butler, M. Ray Mercer (auth.) is a nonfiction available to read on EtoBox.

What is Assessing Fault Model and Test Quality about?

For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only s

Who reads Assessing Fault Model and Test Quality?

Author

Kenneth M. Butler, M. Ray Mercer (auth.)

Publisher

Springer US

Published

1992

Language

EN

ISBN

9780792392224

Category

nonfiction

Subjects

Engineering, Computer Science, Technology