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X-ray And Neutron Reflectivity: Principles And Applications (lecture Notes In Physics Monographs) by Jean Daillant; Alain Gibaud; W Beiglboeck; R Beig; J Ehlers; U Frisch; K Hepp; R L Jaffe; R Kippenhahn; I Ojima; H A Weidenmueller; J Wess; J Zittartz is a nonfiction available to read on EtoBox.

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The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc., makes these the choice for buried interfaces often prob

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Author

Jean Daillant; Alain Gibaud; W Beiglboeck; R Beig; J Ehlers; U Frisch; K Hepp; R L Jaffe; R Kippenhahn; I Ojima; H A Weidenmueller; J Wess; J Zittartz

Publisher

Springer Spektrum. in Springer-Verlag GmbH

Published

1999

Language

EN

ISBN

9783540661955

Category

nonfiction

Subjects

Science, Technology, Chemistry