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About this Materials Science article
A multilayer analyser suitable for linear detection of anomalous small-angle X-ray scattering by Simon, J. P. ;Mainville, J. ;Ziegler, E. ;Lyon, O. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Simon, J. P. ;Mainville, J. ;Ziegler, E. ;Lyon, O.
- Publisher
- International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
- Published
- 1992
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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