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About this Materials Science article
Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests by P. Trtik; C. M. Reeves; P. J. M. Bartos is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- P. Trtik; C. M. Reeves; P. J. M. Bartos
- Publisher
- Springer; Springer-Verlag; Chapman & Hall; Springer Science and Business Media LLC (ISSN 0261-8028)
- Published
- 2000
- Field
- Materials Science (Physical Sciences)